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Forum Post: RE: AFE5805 LVDS TEST PATTERNS and LVDS receive

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Haiteng,

It looks like your bit [0] and bit [1] get stuck for two cycles.  I have never seen this phenomenon in the AFE5805.  What is your FPGA solution? Please try some of the other test patterns like Toggle.  Also, please slow down clock if you are using an external clock.

Thanks,

Chuck Smyth


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