Hi Kirby, I agree that it's difficult to use ESD test results for other tests but I would like to have an opinion. Could you explain me what could be the problem, is a thermal issue on the ESD diode due to pulse duration? Because my current and voltage are under the current and voltage for ESD test. About the duration of the pulse, I have 300ns or 400ns for HBM test in my simulation. For my own overstress pulse, duration is more like 2us. Thanks Matthieu Baque
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