Matthieu, My product engineer responded to me with the ESD information. The HBM ESD voltage the LM98640 can withstand is 4000 V. For this test, we supply 4000 V with a peak current of 2.40-2.93 A for 2-10 ns. The decay time of the peak is 130-170 ns. The ESD test is only to fulfill the JEDEC standard for ESD events on our device. I understand that from a physical standpoint, your transients may be similar to ESD events. It is possible that the device will survive as you have calculated. However, TI cannot officially guarantee or recommend that this device be used in this way because we have not explicitly tested it for the type of transient conditions you say it will experience. That said, if you believe it will work based on your calculations, my recommendation is to test multiple units under the transient conditions to get an idea on the survival rate/reliability for the device. However, if you do experience reliability issues here, TI is not liable because we do not guarantee this specific situation in the datasheet.
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